The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Aug. 26, 2020
Seiko Epson Corporation, Tokyo, JP;
Toru Fujita, Nagano, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A recording condition determining method executed by a recording device performing recording by a main scanning, in which while moving a recording head in a main scanning direction, dots are ejected from nozzles onto a recording medium, and a sub scanning, in which the recording medium is transported in a sub scanning direction. The method includes a patch recording step, the patch recording step being performed by recording patches at a plurality of different positions in the sub scanning direction by a plurality of types of overlap-processing under respectively different recording conditions, in a single recording job performed by the recording device. The method further includes a selection accepting step, and a determination step of determining, as a recording condition of the overlap-processing of an actual recording, the recording condition of the overlap processing corresponding to the patch selected in the selection accepting step.