The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Aug. 26, 2020
Seiko Epson Corporation, Tokyo, JP;
Toru Fujita, Nagano, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A recording condition determining method is executed by a recording device performing recording by a main scanning and a sub scanning. The method includes a patch recording step of recording patches onto a recording medium by the overlap-processing in which the main scanning is performed on a partial region of the recording medium in an overlapping manner a plurality of times, the patch recording step including recording the patches at a plurality of different positions in a main scanning direction by a plurality of types of the overlap-processing under respectively different recording conditions. The method further includes a selection accepting step of accepting selection of a patch from among a plurality of the recorded patches, and a determination step of determining, as the recording condition of the overlap-processing of an actual recording, the recording condition of the overlap-processing associated with the patch selected in the selection accepting step.