The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2022
Filed:
Oct. 26, 2020
Okuma Corporation, Niwa-Gun, JP;
Takuya Kojima, Niwa-Gun, JP;
Tetsuya Matsushita, Niwa-Gun, JP;
Okuma Corporation, Niwa-Gun, JP;
Abstract
An error measurement method for a machine tool measures an error in a machine tool that includes two or more translational axes, a table, and a spindle head. The error measurement method includes installing a masterwork having a plurality of targets on the table and detecting a position of each of the targets using a sensor mounted to the spindle head to acquire a measured value regarding the position of each of the targets and to acquire an error value regarding the position of each of the targets using each of the acquired measured values and a preliminarily acquired calibration value regarding the position of each of the targets. The error measurement method further includes calculating at least one disturbance index value indicative of a degree of disturbance in the measurement for each of the targets, and determining whether the disturbance index value exceeds a preliminarily set threshold.