The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Mar. 12, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takahisa Arai, Kanagawa, JP;

Takeyasu Kobayashi, Kanagawa, JP;

Shunsuke Kodaira, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06N 20/00 (2019.01); G06N 7/00 (2006.01); G16H 30/20 (2018.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/586 (2013.01); A61B 6/582 (2013.01); G01T 7/005 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); G16H 30/20 (2018.01); A61B 6/502 (2013.01);
Abstract

A console includes an image processing unit, a defective pixel map data acquisition unit, a failure condition estimation unit, a notification unit, and a display unit. The defective pixel map data acquisition unit acquires defective pixel map data output from a radiography unit. The failure condition estimation unit receives the defective pixel map data acquired by the defective pixel map data acquisition unit and estimates the failure probability of the radiography unit or the usage state of the radiography unit at the time of failure.


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