The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Feb. 21, 2018
Applicant:

Karl Storz SE & Co. KG, Tuttlingen, DE;

Inventor:

Stefan Rehbein, Immendingen-Hattingen, DE;

Assignee:

KARL STORZ SE & CO. KG, Tuttlingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/307 (2006.01); A61B 1/00 (2006.01); A61B 1/018 (2006.01); A61B 17/3205 (2006.01); A61B 18/14 (2006.01); A61B 18/00 (2006.01); A61B 18/12 (2006.01); A61B 18/04 (2006.01); A61B 18/24 (2006.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/307 (2013.01); A61B 1/00128 (2013.01); A61B 1/018 (2013.01); A61B 17/32056 (2013.01); A61B 18/04 (2013.01); A61B 18/12 (2013.01); A61B 18/1485 (2013.01); A61B 18/24 (2013.01); A61B 2017/00345 (2013.01); A61B 2018/0063 (2013.01); A61B 2018/00172 (2013.01); A61B 2018/00982 (2013.01); A61B 2018/141 (2013.01); A61B 2018/1407 (2013.01); A61B 2018/1435 (2013.01);
Abstract

A probe device (), for a resectoscope () or another microinvasive instrument for working or manipulating tissue, includes a probe shaft () with a cylindrical portion () for arrangement in an instrument shaft () and with a distal end for arrangement near a distal end of the instrument shaft (), an effecting device at the distal end of the probe shaft (), and a sealing device () with a probe shaft channel () in which the cylindrical portion () of the probe shaft () is arranged. The probe shaft () is movable relative to the sealing device () parallel to the longitudinal axis of the probe shaft () and parallel to the longitudinal axis of the probe shaft channel (). The sealing device () is formed from metal or ceramic or from another non-elastic material and is connected permanently to the probe shaft ().


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