The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Aug. 21, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dalin Zhu, Richardson, TX (US);

Boon Loong Ng, Plano, TX (US);

Jianhua Mo, Allen, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 72/08 (2009.01); H04B 7/08 (2006.01); H04W 72/04 (2009.01); H04L 43/16 (2022.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04W 72/085 (2013.01); H04B 7/0808 (2013.01); H04B 7/088 (2013.01); H04B 17/318 (2015.01); H04L 43/16 (2013.01); H04W 24/08 (2013.01); H04W 72/046 (2013.01);
Abstract

A user equipment, a method, and computer-readable media. The UE, which includes a transceiver with a plurality of antenna panels, is configured to determine a link quality of a serving antenna panel. If the link quality of the serving panel is below a quality threshold, resources are allocated from the serving antenna panel to another antenna panel during a sweeping period to identify one or more beams of a target antenna panel for resuming communications. Measurements for a set of beams of the other antenna panel are obtained, during the sweeping period, with the allocated resources. The other antenna panel can be determined to be the target antenna panel based on the obtained measurements. The UE can switch from the serving antenna panel to the target antenna panel, select the one or more beams based on the obtained measurements, and resume the communications on the selected one or more beams.


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