The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Aug. 29, 2019
Applicant:

Beijing Xiaomi Intelligent Technology Co., Ltd., Beijing, CN;

Inventor:

Jiongliang Li, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 15/22 (2006.01); H04W 56/00 (2009.01); H04B 7/0408 (2017.01); H04B 7/06 (2006.01); H04L 27/26 (2006.01); G10L 21/0216 (2013.01);
U.S. Cl.
CPC ...
H04W 56/0065 (2013.01); G10L 15/22 (2013.01); G10L 21/0216 (2013.01); H04B 7/0408 (2013.01); H04B 7/0617 (2013.01); H04B 7/0695 (2013.01); H04L 27/2657 (2013.01); H04L 27/2666 (2013.01); G10L 2015/223 (2013.01); G10L 2021/02166 (2013.01);
Abstract

The present disclosure relates to a method and device for selecting from a plurality of beams. The method includes: obtaining a plurality of beam data, and performing frequency sampling on each of the plurality of beam data; obtaining a plurality of beam frequency correlation coefficients based on frequency sampling data of each of the plurality of beam data, in which a beam frequency correlation coefficient is configured to indicate a similarity between one in the plurality of beam data and another one in the plurality of beam data; obtaining a beam frequency correlation coefficient sum corresponding to each of the plurality of beam data based on the plurality of beam frequency correlation coefficients; and selecting beam data having the beam frequency correlation coefficient sum satisfying a preset correlation coefficient requirement in the plurality of beam data as target beam data.


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