The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Feb. 27, 2020
Applicants:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

At&t Mobility Ii Llc, Atlanta, GA (US);

Inventors:

Supratim Deb, Edison, NJ (US);

He Yan, Berkeley Heights, NJ (US);

Karunasish Biswas, Sammamish, WA (US);

Joseph Allen Notter, Lakewood, CO (US);

Assignees:

AT&T Intellectual Property I, L.P., Atlanta, GA (US);

AT&T Mobility II LLC, Atlanta, GA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/04 (2009.01); G06N 20/00 (2019.01); G06Q 10/06 (2012.01); H04W 88/08 (2009.01); H04W 84/04 (2009.01);
U.S. Cl.
CPC ...
H04W 24/04 (2013.01); G06N 20/00 (2019.01); G06Q 10/0635 (2013.01); H04W 84/042 (2013.01); H04W 88/08 (2013.01);
Abstract

A method, system and computer-readable medium where a weighted composite quality index having a plurality of components for a network element is identified. A historical baseline value from historical data for each component is determined, and a deviation from the historical baseline values is measured. A risk level for the deviation is assigned. A loss score for the measured components is computed by mapping the risk level to a numerical score. An aggregated risk score based on a sum of weighted risk scores for each of the components is computed. An expected risk score based on probabilities associated with the aggregated risk score is determined by computing future probabilities of each risk level at the network element based on a trained machine learning model.


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