The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Jun. 08, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Norifumi Kamiya, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/41 (2006.01); H03M 13/39 (2006.01); H03M 13/13 (2006.01); H03M 13/25 (2006.01);
U.S. Cl.
CPC ...
H03M 13/4115 (2013.01); H03M 13/13 (2013.01); H03M 13/256 (2013.01); H03M 13/3961 (2013.01); H03M 13/41 (2013.01);
Abstract

A decoding apparatus includes a multi-input branch metric calculation unit configured to calculate, by using a branch label corresponding to a path extending toward a state S at a time point N in a trellis diagram and a plurality of reception signal sequences, a branch metric in the state S, a path metric calculation unit configured to calculate a path metric in the state S at the time point N, and a surviving path list memory configured to store path labels corresponding to L path metrics among a plurality of calculated path metrics. The path metric calculation unit generates a path label in the state S at the time point N by combining the branch label with a path label in each of the states at the time point N−1 and the surviving path list memory outputs path labels corresponding to L path metrics.


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