The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Dec. 19, 2019
Applicant:

Avx Corporation, Fountain Inn, SC (US);

Inventors:

Kwang Choi, Simpsonville, SC (US);

Marianne Berolini, Greenville, SC (US);

Assignee:

KYOCERA AVX Components Corporation, Fountain Inn, SC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 1/00 (2006.01); H03H 3/00 (2006.01);
U.S. Cl.
CPC ...
H03H 1/00 (2013.01); H03H 3/00 (2013.01); H03H 2001/0014 (2013.01); H03H 2001/0085 (2013.01);
Abstract

A multilayer filter may include a plurality of dielectric layers stacked in a Z-direction. A first conductive layer may overlie one of the dielectric layers, and a second conductive layer may overlie another of the dielectric layers and be spaced apart from the first conductive layer in the Z-direction. A first via may be connected with the second conductive layer at a first location. A second via may be connected with the second conductive layer at a second location that is spaced apart in a first direction from the first location. The first conductive layer may overlap the second conductive layer at an overlapping area to form a capacitor. At least a portion of the overlapping area may be located between the first location and the second location in the first direction. The second conductive layer may be free of via connections that intersect the overlapping area.


Find Patent Forward Citations

Loading…