The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Oct. 16, 2018
Applicant:

Lumentum Operations Llc, Milpitas, CA (US);

Inventors:

Tobyn VanVeghten, San Jose, CA (US);

Joseph J. Alonis, Palo Alto, CA (US);

James J. Morehead, Milpitas, CA (US);

Loren A. Eyres, Palo Alto, CA (US);

Assignee:

Lumentum Operations LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/11 (2006.01); H01S 3/094 (2006.01); G01J 11/00 (2006.01); H01L 27/146 (2006.01); H01L 25/16 (2006.01); G01J 1/02 (2006.01); G01J 1/18 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
H01S 3/1127 (2013.01); G01J 1/0228 (2013.01); G01J 1/18 (2013.01); G01J 1/4257 (2013.01); G01J 11/00 (2013.01); H01L 25/167 (2013.01); H01L 27/14643 (2013.01); H01S 3/094076 (2013.01); G01J 2001/4238 (2013.01);
Abstract

A device may determine at least one metric related to a plurality of laser pulses associated with a Q-switched laser. The device may determine a statistical metric for the at least one metric related to the plurality of laser pulses. The device may determine that the statistical metric satisfies a threshold level of deviation of the at least one metric related to the plurality of laser pulses from a baseline value for the at least one metric. The device may indicate laser degradation of the Q-switched laser based on determining that the statistical metric satisfies the threshold.


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