The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Oct. 28, 2020
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Fan Zhang, Fremont, CA (US);

Aman Bhatia, Los Gatos, CA (US);

Xuanxuan Lu, San Jose, CA (US);

Meysam Asadi, Fremont, CA (US);

Haobo Wang, San Jose, CA (US);

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/10 (2006.01); G11C 16/30 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G11C 16/10 (2013.01); G11C 16/26 (2013.01); G11C 16/30 (2013.01);
Abstract

A controller optimizes a read threshold value for a memory device using model-less regression. The controller performs read operations on cells using read threshold voltage values. The controller measures probability values for the multiple read threshold voltage values, and estimates a threshold voltage distribution curve based on the multiple read threshold voltage values and the measured probability values using a set regression formula. The controller determines a read threshold voltage value corresponding to a set point on the threshold voltage distribution curve, and performs a read operation on the cells using the read threshold voltage value.


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