The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Oct. 18, 2017
Volume Graphics Gmbh, Heidelberg, DE;
Christoph Poliwoda, Mannheim, DE;
Thomas Gunther, Heidelberg, DE;
Christof Reinhart, Heidelberg, DE;
Volume Graphics GmbH, Heidelberg, DE;
Abstract
Described is a computer-implemented method for determining material interfaces of an object from at least one measurement of the object, a rasterized representation of the object being produced by means of the measurement, the rasterized representation having a plurality of measurement points, a measurement point having at least one piece of image information, which indicates a value of a measurement variable for the object at the position of the measurement point. The method comprises the determining of a parameterization of the rasterized representation of the object, the parameterization assigning at least one parameter to each of the measurement points of a subset of the measurement points of the representation, and the applying of at least one parameter-dependent edge-detection operator to the measurement points of the rasterized representation, an edge-detection operator being designed to determine the location of at least one material interface in the rasterized representation.