The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Dec. 06, 2019
Applicant:

Nextworld Llc, Denver, CO (US);

Inventors:

Michael Elges, Littleton, CO (US);

Alec P. Ruth, Parker, CO (US);

Reece M. Hughes, Centennial, CO (US);

Assignee:

Nextworld, LLC, Greenwood Village, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3664 (2013.01); G06F 11/3692 (2013.01);
Abstract

In non-limiting examples of the present disclosure, systems, methods and devices for assisting with testing custom application software are provided. An input that modifies an application action may be received. A request to execute a test action corresponding to the application may be received. One or more test steps for executing the test action may be identified. Each of the one or more test steps may be executed in a test framework utilizing test metadata. A determination may be made as to whether an unexpected result occurred during the execution of the one or more steps. If an unexpected result is determined to have occurred, a graphical representation of the unexpected result may be caused to be displayed.


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Quick Actions:

Elges, Michael. (2022). Automated testing for metadata-driven custom applications (U.S. Patent No. 11334472). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11334472

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