The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Feb. 13, 2020
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Takaharu Hiroe, Tokyo, JP;
Kazunari Ide, Tokyo, JP;
Yoshikatsu Ikawa, Tokyo, JP;
Ryo Sase, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An abnormality detecting apparatus that is configured to detect a presence or absence of an abnormality in a rotating machine includes a processor that is configured to execute a measured value acquisition process of acquiring, on the basis of a detection signal output from a vibration sensor that is configured to measure vibration caused by rotation of the rotating machine, a measured value including an amplitude and a phase of the vibration; a Mahalanobis distance calculation process of calculating a Mahalanobis distance of the measured value acquired at a time point at which the rotating machine is evaluated on the basis of a unit space configured with a plurality of measured values acquired at a plurality of past time points; and a determination process of determining that an abnormality has occurred in the rotating machine in a case where the calculated Mahalanobis distance exceeds a predetermined threshold value.