The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Jan. 21, 2020
Applicant:

GE Inspection Technologies, Lp, Lewistown, PA (US);

Inventors:

Jagadish Gattu, Randolph, MA (US);

Nimrod Ohad, Schenectady, NY (US);

Assignee:

WAYGATE TECHNOLOGIES USA, LP, Houston, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G06Q 50/08 (2012.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G05B 23/0235 (2013.01); G05B 23/0272 (2013.01); G05B 23/0281 (2013.01); G05B 23/0283 (2013.01); G06Q 50/04 (2013.01); G06Q 50/08 (2013.01);
Abstract

Systems, methods, and computer readable storage mediums for performing sensor health monitoring are described. The method includes verifying data quality and suppressing alert generation using machine learning techniques to identify whether two anomalies generated by an asset monitoring system are related. The method can include receiving data characterizing measurement data acquired by a sensor coupled to an industrial asset. An anomalous data sample within the received data can be identified and removed from the anomalous data sample. A new sample of the removed data sample can be estimated using interpolation and the new sample can be assessed. Maintenance analysis can be performed based on the assessed, estimated new sample.


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