The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Dec. 04, 2019
National Taiwan University, Taipei, TW;
Chi-Kuang Sun, Fremont, CA (US);
Bhaskar Jyoti Borah, Taipei, TW;
NATIONAL TAIWAN UNIVERSITY, Taipei, TW;
Abstract
The field of view (FOV) of a nonlinear optical microscope (NLOM) is expected to be large enough for employing high-speed raster scanning on a mesoscale volumetric biological sample. Concurrently, three-dimensional (3D) visualization of fine sub-micron biological structures requires high enough lateral and axial resolutions, enforcing a high numerical aperture (NA) objective lens to be employed, thereby limiting the FOV of an NLOM. The invention is directed to a laser scanning NLOM, or to a large-angle optical raster scanning system, for deep biological tissue imaging with a large FOV of more than one square millimeter, up to 1.6×1.6 mm, while simultaneously maintaining a sub-femtoliter effective 3D resolution by means of a high-NA and low magnification objective lens and further maintaining a high acquisition speed with synchronized sampling, limited by the repetition rate of a high repetition rate pulsed laser source, thereby exceeding Nyquist Criterion for resolving micro-optical resolution throughout a horizontal FOV of more than one millimeter.