The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Mar. 13, 2020
Applicants:

Haotian Zhu, Nanjing, CN;

KE Wu, Saint-Laurent, CA;

Jules Gauthier, Laval, CA;

Inventors:

Haotian Zhu, Nanjing, CN;

Ke Wu, Saint-Laurent, CA;

Jules Gauthier, Laval, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0675 (2013.01); G01R 1/06755 (2013.01); G01R 1/06794 (2013.01);
Abstract

A probe includes a first rod having a first axis and a second rod having a second axis. A first end of the first rod is connected to a first end of the second rod to form an angle that maintains a 'total internal reflection' effect for waves propagating through the probe. A second end of the second rod includes a prong facilitating attachment of the probe to a housing block. The first axis and the second axis define a plane. A second end of the first rod includes a tapered face formed perpendicular to the plane. The tapered face is sufficiently flat to make planar contact with a portion of a component under study. A support is formed in the plane and connected to the second rod. A second end of the support includes a connector to facilitate attachment of the probe to the housing block.


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