The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Feb. 10, 2020
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Kazuhiro Sasaki, Kobe, JP;

Takeshi Yamamoto, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01); G01N 15/1436 (2013.01); G01N 2021/6421 (2013.01); G01N 2021/6478 (2013.01);
Abstract

Disclosed is a sample measurement device including a light applicator configured to apply a light to a sample so as to generate light from a particle in the sample; an optical block in which a plurality of prisms are fixed, each of the plurality of prisms including a light entry surface which allows entry thereinto of the light generated from the particle in the sample, a reflection surface configured to selectively reflect a part of the light having entered the light entry surface, and a light outputting surface configured to output the light reflected by the reflection surface; and a light receiver configured to receive the light outputted from the light outputting surface of each of the plurality of prisms.


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