The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Jun. 17, 2019
Honeywell International Inc., Morris Plains, NJ (US);
Tobias Nebel, North Vancouver, CA;
Gertjan Hofman, Vancouver, CA;
Michael Kon Yew Hughes, Vancouver, CA;
Sebastien Tixier, North Vancouver, CA;
HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);
Abstract
A measurement apparatus includes a beta gauge for generating a first sensor response signal from a composite sheet including a sheet material having a coating thereon including a high-z material or the sheet material has particles including the high-z material embedded in the sheet material. A second sensor being an x-ray or an infrared (IR) sensor provides a second sensor response signal from the composite sheet. A computing device is coupled to receive the first and the second sensor response signal that includes a processor having an associated memory for implementing an algorithm that uses the first and the second sensor response signal to simultaneously compute two or more weight measures selected from (i) a weight per unit area of the high-z material, (ii) a weight per unit area of the sheet material, and (iii) a total weight per unit area of the composite sheet.