The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Dec. 13, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Keita Ebisawa, Moriyama, JP;

Shingo Hayashi, Otsu, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01B 11/00 (2006.01); G01D 5/04 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01B 11/005 (2013.01); G01D 5/04 (2013.01);
Abstract

Provided is a method for more accurately correcting position coordinates of a point on an object to be imaged, the coordinates being identified based on values detected by linear scales. A visual field is moved to a measurement point defined on a recessed portion formed on a calibration plate, and an image is captured (step S-), edges are detected from an image of sides of the recessed portion (step-), an intersection of the edges is calculated (step S-), values of the intersection as actually measured by the linear scales are saved (step S-), and position coordinates of the point on the object to be imaged as detected by the linear scales are corrected by using a true value and a difference.


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