The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Nov. 17, 2016
Samsung Electronics Co., Ltd., Suwon-si, KR;
Kyu Youn Hwang, Sejong, KR;
Young Seop Seong, Ansan-si, KR;
Jong Myeon Park, Seongnam-si, KR;
Jeo Young Shim, Yongsin-si, KR;
Do Gyoon Kim, Seongnam-si, KR;
Jae Sung Lee, Suwon-si, KR;
Hae Seok Lee, Yongin-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A fluid analysis cartridge having an improved structure in order to increase test reliability, and a fluid analysis apparatus including the same are disclosed. The fluid analysis apparatus comprises: a housing having a fluid supply part for supplying a fluid sample, and a filter member arranged such that the fluid sample supplied to the fluid supply part passes therethrough; a fluid analysis cartridge having a test unit that is connected to the housing so that the fluid sample that has passed through the filter member can be introduced and a test can be performed; and a pressure member that is arranged to pressurize the fluid analysis cartridge in order to move the fluid sample supplied to the fluid supply part to the test unit, wherein the test unit includes a first panel that has a first inflow part facing the filter member, and a second panel that is arranged to face the first panel and that has a second inflow part corresponding to the first inflow part, and the first inflow part may have a smaller width than the second inflow part.