The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Jun. 19, 2018
Applicant:

Job Corporation, Kanagawa, JP;

Inventors:

Tsutomu Yamakawa, Kanagawa, JP;

Shuichiro Yamamoto, Kanagawa, JP;

Assignee:

JOB Corporation, Kanagawa, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
A61B 6/584 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 2223/618 (2013.01);
Abstract

In an X-ray inspection, a detection unit with a detector is provided. The detection unit detects transmitted amounts of the X-rays generated by an X-ray generator and transmitted through the object in each of n-number X-ray energy bins (n is a positive integer of 2 or more) which are set in advance to the X-rays, and outputs detection signals corresponding to the transmitted amounts. An information acquisition unit acquires, based on the detection signal, information showing a thickness t of the object and an average linear attenuation coefficient μ in a transmission direction of fluxes of the X-rays, in each of the energy bins. A pixel data calculation unit calculates, based on the acquired information, pixel data composed of pixel values each obtained by multiplying addition information by the thickness t. Addition information is obtained by mutual addition of the average linear attenuation coefficients μ in the respective energy bins.


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