The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2022
Filed:
Mar. 25, 2019
Koninklijke Philips N.v., Eindhoven, NL;
Petrus Johannes Withagen, Halsteren, NL;
Erik Hummel, Eindhoven, NL;
Peter George Van De Haar, Eindhoven, NL;
Fred Simon Berend Van Nijnatten, Eindhoven, NL;
Joost Adrianus Van Rooijen, Best, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a device for controlling a position of an anti-scatter grid in an X-ray image acquisition system, the device () comprising: a measurement unit (); a control unit (); and a shifting unit (); wherein the measurement unit () is configured to determine an X-ray beam focus position () of an X-ray radiation source of the X-ray image acquisition system with respect to an X-ray detector of the X-ray image acquisition system; wherein the control unit () is configured to generate a shifting signal based on a displacement () between the X-ray beam focus position () and a grid focus position () of the anti-scatter grid; and wherein, based on the shifting signal, the shifting unit () is configured to shift an anti-scatter grid of the X-ray image acquisition system in at least one direction to align the anti-scatter grid with the X-ray beam focus position (), provides an improved anti-scatter grid for X-ray acquisition systems. The invention provides the use of an improved anti-scatter grid () for X-ray acquisition systems ().