The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Oct. 04, 2019
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Dae Hong Kim, Seongnam-si, KR;

Hyungjin Lee, Suwon-si, KR;

Sung Hoon Yang, Seoul, KR;

Se Yoon Oh, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G09G 3/00 (2006.01); G06T 7/00 (2017.01); G01R 31/28 (2006.01); G01R 19/00 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 19/0053 (2013.01); G01R 31/2806 (2013.01); G06T 7/0004 (2013.01); G06T 7/70 (2017.01); G06T 2207/30121 (2013.01);
Abstract

An inspecting device of a display panel includes a contact including first probe pins that contact to data pads of a display panel and second probe pins that contact to common voltage pads of the display panel, a signal generator coupled to the first probe pins, the signal generator configured to generate a first data voltage corresponding to a first gray level and a second data voltage corresponding to a second gray level, a power generator coupled to the second probe pins, the power generator configured to generate a first common voltage and a second common voltage of which a voltage level is different from a voltage level of the second common voltage, and a defect detector configured to detect a defect of the display panel by removing a contact noise generated due to contact failure of the first probe pins and the second probe pins.


Find Patent Forward Citations

Loading…