The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Apr. 12, 2019
Applicant:

Northeastern University, Shenyang, CN;

Inventors:

Jinliang Ding, Shenyang, CN;

Quan Xu, Shenyang, CN;

Meirong Xu, Shenyang, CN;

Xiaoran Yu, Shenyang, CN;

Assignee:

NORTHEASTERN UNIVERSITY, Shenyang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06V 10/753 (2022.01); G06K 9/6215 (2013.01);
Abstract

The invention provides a visualized time sequence pattern matching method based on Hough transformation, and relates to the technical field of data visualization analysis. The method comprises the steps of: firstly, judging whether historical data to be matched is one-dimensional time sequence data or multi-dimensional time sequence data, and if the historical data to be matched is the multi-dimensional time sequence data, performing normalization processing; performing time sequence selection: selecting a time sequence to be matched from the historical data in a time window pattern, and eliminating the selected time sequence from the historical data; converting a time sequence image in original coordinates to Hough space through the Hough transformation, and judging the similarity matching situation of the time sequence through a voting mechanism; and finally, screening the finally-matched results according to the voting results.


Find Patent Forward Citations

Ding, Jinliang. (2022). Visualized time sequence pattern matching method for data visualization analysis based on hough transformation (U.S. Patent No. 11328502). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11328502

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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