The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Oct. 16, 2020
Applicant:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Inventors:

Tom Hsi Hao Shang, Forest Hills, NY (US);

Elena Dotsenko, Princeton, NJ (US);

Liang Luo, Harrison, NJ (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 7/80 (2017.01); G06T 7/73 (2017.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06T 7/80 (2017.01); G06T 17/00 (2013.01); H04N 5/247 (2013.01); G06T 2200/08 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30196 (2013.01);
Abstract

An illustrative image processing system determines calibration parameters for a set of cameras including a first camera configured to capture a scene from a first vantage point and a second camera configured to capture the scene from a second vantage point. The image processing system obtains pose data for an object included in the scene and depicted by first and second images captured, respectively, by the first and second cameras. The pose data is representative of how the object is capable of being posed. Based on the calibration parameters, the pose data, and the first and second images, the image processing system estimates a pose of the object in the scene independently of depth data for the object. The image processing system also generates model data of the scene that includes a volumetric representation of the object in the estimated pose. Corresponding methods and systems are also disclosed.


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