The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Sep. 23, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Minoru Nakamura, Yamanashi, JP;

Yuuki Takahashi, Yamanashi, JP;

Atsushi Watanabe, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/70 (2017.01); H04N 5/235 (2006.01); H04N 5/225 (2006.01); G01S 17/89 (2020.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G01S 17/89 (2013.01); G06K 9/6215 (2013.01); H04N 5/2253 (2013.01); H04N 5/2351 (2013.01); G06T 2207/10028 (2013.01);
Abstract

The object detection system includes a TOF sensor which outputs an image of a target space on the basis of a phase difference between reference light emitted toward the target space and reflected light from the target space, an object detection section which detects a position of an object present in the target space on the basis of the output image, an imaging conditions calculation section which calculates imaging conditions including at least one of an integration time and a light emission period of the TOF sensor on the basis of an image of the detected object, and an imaging conditions changing section which changes a configuration of the TOF sensor to the calculated imaging conditions, and the object detection section detects a position of the object on the basis of the image output under the changed imaging conditions.


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