The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Dec. 04, 2019
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Christopher Allen Niedzwiedz, Austin, TX (US);
James Anil Pramod Kotwal, Austin, TX (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/56 (2013.01); H04L 9/08 (2006.01); G06F 9/451 (2018.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 9/451 (2018.02); G06F 21/552 (2013.01); G06F 21/564 (2013.01); G06F 21/566 (2013.01); H04L 9/0869 (2013.01);
Abstract
A method of determining a level of potential risk associated with a potential vulnerability identified in a software application. The method includes generating simulated loss events, determining a plurality of impacts for the simulated loss events, determining the level of potential risk based on the plurality of impacts, and providing a graphical user interface based on the level of potential risk.
Niedzwiedz, Christopher. (2022). Application vulnerability rating system (U.S. Patent No. 11328068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11328068
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile