The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Mar. 27, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yasushi Miyata, Tokyo, JP;

Yohsuke Ishii, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/28 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 16/285 (2019.01); G06F 16/35 (2019.01); G06F 16/355 (2019.01);
Abstract

A data analysis device is configured to include an arithmetic operation device that determines whether or not each point data in the point data group of the existing clusters is a core of the cluster using a predetermined algorithm and calculates a predetermined re-verification determination data, recalculates an initial condition value of the clustering based on the re-verification determination data, specifies re-verification point data which is the point data that becomes no longer the core or becomes a new core by adding the point data, from the point data group to which the addition was made, based on the updated initial condition value obtained by the recalculation, and performs predetermined clustering processing in accordance with the re-verification point data.


Find Patent Forward Citations

Miyata, Yasushi. (2022). Data analysis device and data analysis method (U.S. Patent No. 11328024). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11328024

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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