The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Jul. 28, 2020
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Madhusudhanan Krishnamoorthy, Chennai, IN;

Rajasekhar Reddy Patlolla, Telangana, IN;

Shilpi Prashant Choudhari, Telangana, IN;

Thenamudhan Arumugasamy, Chennai, IN;

Giddaiah Kummari, Chennai, IN;

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2457 (2019.01); G06F 9/46 (2006.01); G06F 16/21 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24578 (2019.01); G06F 9/466 (2013.01); G06F 16/219 (2019.01); G06N 20/00 (2019.01);
Abstract

A guided sampling tool guides the sampling of datapoints in large datasets. Generally, the guided sampling tool applies a machine learning algorithm to a database of historical issues encountered by an organization to guide the sampling of a large dataset. The guided sampling tool can evaluate and change provided variables and weights for performing a sampling. After the datapoints are sampled, the guided sampling tool compares the historic transactions represented by those datapoints to baseline images to determine if the historic transactions encountered a problem or issue, which would affect the overall quality assessment.


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