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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11327829 B1

PDFFull Text
Date of Patent:
May. 10, 2022

Filed:

Sep. 05, 2019

Semiconductor device which detects occurrence of an abnormality during operation based on a comparison of an input specifying a pwm signal and an estimated input obtained from an inverse operation

Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventor:

Shigeru Nakajima, Zama Kanagawa, JP;

Assignees:

KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;

TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION, Tokyo, JP;

Attorney:

Holtz, Holtz & Volek PC

Primary Examiner:

Joseph O Schell

Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 11/07 (2006.01); G06F 11/16 (2006.01); H03M 1/10 (2006.01); G01R 31/3167 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0796 (2013.01); G06F 11/1641 (2013.01); G01R 31/3167 (2013.01); H03M 1/1095 (2013.01);
Abstract

A semiconductor device of an embodiment includes a main circuit configured to perform a predetermined operation to an input signal to output an output signal, an inverse operation circuit configured to receive the output signal of the main circuit as an input, and perform an inverse operation of the predetermined operation by using the output signal to output an inverse operation result signal, and a comparison circuit configured to compare the input signal and the inverse operation result signal, and output a predetermined signal when the input signal and the inverse operation result signal do not coincide with each other.

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Quick Actions:

Nakajima, Shigeru. (2022). Semiconductor device which detects occurrence of an abnormality during operation based on a comparison of an input specifying a pwm signal and an estimated input obtained from an inverse operation (U.S. Patent No. 11327829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11327829

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