The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Aug. 07, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuki Tanaka, Tokyo, JP;

Kazuhiko Minematsu, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/58 (2006.01);
U.S. Cl.
CPC ...
G06F 7/58 (2013.01);
Abstract

A generation meansgenerates a uniform random number between 0 and a first probability, which is a probability of a stochastic variable becoming a value within a predetermined interval in a positive range in the first discrete distribution. When a uniform random number less than or equal to a second probability is generated, the second probability being a probability of the stochastic variable becoming a value within a predetermined interval in a second discrete distribution, which is a discrete Gaussian distribution on a one-dimensional lattice the center of which is the origin, the selection meansselects, as a random number generation method, an accumulation method in which a functional value defining the second discrete distribution is used. When a uniform random number greater than the second probability is generated, the selection meansselects a rejection sampling method as the random number generation method.


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