The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Feb. 17, 2021
Seiko Epson Corporation, Tokyo, JP;
Mirza Tahir Ahmed, Vaughan, CA;
Yang Yang, Richmond Hill, CA;
Seiko Epson Corporation, Tokyo, JP;
Abstract
An operation detection method of detecting an operation of a pointing element with respect to an operation surface includes converting first and second taken image obtained by imaging the operation surface into first and second converted taken image calibrated with respect to the operation surface respectively, determining whether or not the pointing element contacts with the operation surface and is in a resting state based on the first and second converted taken image, selecting the first and second converted taken image at when it was determined that the pointing element contacts and to be in the resting state as first and second reference image, calculating a first difference in position between the pointing element in the first reference image and the pointing element in the first converted taken image, calculating a second difference in position between the pointing element in the second reference image selected and the pointing element in the second converted taken image, and determining whether or not the pointing element separated from the operation surface based on the first difference and the second difference.