The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Apr. 12, 2021
Applicant:

Nanjing Peixuan Yapu Optoelectronic Technology Co., Ltd., Beijing, CN;

Inventors:

Hong Xiang, Beijing, CN;

Anpei Ye, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 27/58 (2006.01); G01N 21/64 (2006.01); H04N 5/225 (2006.01); H04N 5/76 (2006.01); H04N 5/265 (2006.01); H04N 5/04 (2006.01); G06T 5/50 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0072 (2013.01); G01N 21/6458 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01); G02B 21/02 (2013.01); G02B 21/26 (2013.01); G02B 27/58 (2013.01); G06T 5/50 (2013.01); H04N 5/04 (2013.01); H04N 5/2256 (2013.01); H04N 5/265 (2013.01); H04N 5/76 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20221 (2013.01);
Abstract

An optical imaging equipment and method. The optical imaging equipment includes an optical microscope, an objective table, a light source module and an objective lens. The objective table is movable in the XY-plane, the light source module contains illumination light sources, a narrowband filters and the objective lens is movable in the Z-axis direction; a three dimensions (3D) electric sample table is fixed on the objective table, which is used for carrying a sample to be tested and driving the sample to move in 3D directions relative to the objective table; a microsphere is fixed on a transparent substrate; the objective lens, the microsphere and the sample to be tested are arranged in the Z-axis direction in sequence, wherein, the transparent substrate along with the microsphere thereon can be moved to a first position and remain stationary relative to the objective table in the Z-axis direction, the 3D electric sample table can adjust the sample to be tested with respect to the microsphere to an imaging plane which is parallel to the XY-plane and a first image is formed by the microsphere, the objective lens can be adjusted to a second position so that the objective lens can perform a secondary imaging of the first image to form a second image.


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