The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Dec. 28, 2018
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Xiulin Ni, Beijing, CN;
Jianmin Li, Beijing, CN;
Haitian Tan, Beijing, CN;
Yulan Li, Beijing, CN;
Weifeng Yu, Beijing, CN;
Yuanjing Li, Beijing, CN;
Hejun Zhou, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Chunguang Zong, Beijing, CN;
Li Zhang, Beijing, CN;
Other;
Abstract
The present disclosure relates to the technical field of CT detection, in particular to a CT inspection system and a CT imaging method. The CT inspection system provided by the present disclosure includes a scanning device and an imaging device, wherein the scanning device having a radioactive source device and a detection device is configured to rotate at a nonuniform speed in at least partial process of scanning an object to be detected; and the imaging device generates a CT image based on effective detection data, wherein the effective detection data refer to data acquired each time the detection device rotates by a preset angle. In the present disclosure, the imaging device of the CT inspection system generates a CT image based on data acquired each time the detection device rotates by a preset angle, which, compared with traditional image collection solutions, can effectively reduce image deformation and improve accuracy of detection results.