The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Jul. 19, 2021
Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, CN;
Linong Liu, Beijing, CN;
Zhengwei Li, Beijing, CN;
Baokun Lu, Beijing, CN;
Jiangjie Zhang, Beijing, CN;
Jianfeng Zhang, Beijing, CN;
Abstract
The present disclosure provides a method and a device for imaging diffracted waves based on azimuth-dip angle gathers and a storage medium, which relates to the technical field of seismic exploration, comprising firstly acquiring seismic data and generating target azimuth-dip angle gathers based on the seismic data, wherein the target azimuth-dip angle gathers are a set of all azimuth-dip angle gathers in which the Fresnel zones have been muted, and each of the azimuth-dip angle gathers represents a dip-angle gather corresponding to each azimuth angle; then detecting diffracted waves based on the target azimuth-dip angle gathers, and determining the type of the diffracted waves; and finally, imaging the diffracted waves based on the type of the diffracted waves to obtain a diffracted wave imaging result.