The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Mar. 27, 2020
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/34 (2006.01); G01S 7/35 (2006.01);
U.S. Cl.
CPC ...
G01S 13/34 (2013.01); G01S 7/352 (2013.01); G01S 7/356 (2021.05); G01S 13/343 (2013.01);
Abstract
In the proposed low complexity technique a hierarchical approach is created. An initial FFT based detection and range estimation gives a coarse range estimate of a group of objects within the Rayleigh limit or with varying sizes resulting from widely varying reflection strengths. For each group of detected peaks, demodulate the input to near DC, filter out other peaks (or other object groups) and decimate the signal to reduce the data size. Then perform super-resolution methods on this limited data size. The resulting distance estimations provide distance relative to the coarse estimation from the FFT processing.