The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Jan. 16, 2018
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Masafumi Shimada, Tokyo, JP;

Isao Yamazaki, Tokyo, JP;

Masaharu Nishida, Tokyo, JP;

Yoko Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1009 (2013.01); G01N 2035/1018 (2013.01); G01N 2035/1025 (2013.01);
Abstract

The purpose of the present invention is to provide an automatic analysis device capable of determining, through a simple processing, whether or not idle aspirate has occurred. The automatic analysis device according to the present invention determines whether or not idle aspirate has occurred, by calculating a parameter which specifies whether or not the length of a portion of a path through which the sample passes inside a dispensing probe is shorter than that during normal aspirate, the portion being actually filled with a sample (see FIG.).


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