The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Nov. 30, 2018
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Tomoyuki Nose, Kobe, JP;
Sayuri Tomoda, Kobe, JP;
Yusuke Miida, Kobe, JP;
Kazuyoshi Horii, Kobe, JP;
Kenichiro Suzuki, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 35/00069 (2013.01); G01N 35/00693 (2013.01); G01N 35/1002 (2013.01); G01N 35/00029 (2013.01); G01N 35/0098 (2013.01); G01N 2035/00574 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/00851 (2013.01);
Abstract
A sample measuring method of optically measuring a sample housed in a container in a sample measurement device, the method including: loading the container such that the container is shielded from light; starting to read information regarding a measurement to be performed on the sample in response to the loading the container; and measuring the sample based on the read information.