The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Jan. 25, 2019
Applicant:

Tdk Corporation, Tokyo, JP;

Inventor:

Matthias König, Freising, DE;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0006 (2013.01); G01N 33/007 (2013.01); G01N 33/0016 (2013.01); G01N 33/0075 (2013.01); G01N 2033/0072 (2013.01);
Abstract

A method for testing a plurality of sensor devices, a panel and a sensor component are disclosed. In an embodiment a method includes providing the plurality of sensor devices, each sensor device including a sensor element configured to sense an ambient condition, a heating element to heat the sensor element, connection terminals for a supply voltage and at least one connection terminal for a sense signal indicative of a state of the sensor element, providing a panel including a plurality of groups of connection pads, the connection pads of each one of the groups configured to be connected to the connection terminals of one of the sensor devices, mounting the sensor devices to the groups of connection pads, applying a supply voltage to the sensor devices and concurrently heating the heating elements of the sensor devices to an elevated temperature and calibrating the sensor devices at least one after another.


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