The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Aug. 16, 2019
Ning Fang, Alpharetta, GA (US);
Bin Dong, Atlanta, GA (US);
Kuangcai Chen, Alpharetta, GA (US);
Fei Zhao, Atlanta, GA (US);
Ning Fang, Alpharetta, GA (US);
Bin Dong, Atlanta, GA (US);
Kuangcai Chen, Alpharetta, GA (US);
Fei Zhao, Atlanta, GA (US);
Other;
Abstract
An integrated spectro-microscopic system for multimodality imaging on a sample includes a reflected differential interference contrast (RDIC) microscope, a Raman spectroscope optically coupled with the RDIC microscope and a total internal reflection fluorescence/scattering (TIRF/TIRS) microscope optically coupled with the RDIC microscope such that the integrated spectro-microscopic system is capable of simultaneously acquiring both the RDIC images, the Raman spectra and TIRF/TIRS images on the same sample.