The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Aug. 16, 2019
Applicants:

Ning Fang, Alpharetta, GA (US);

Bin Dong, Atlanta, GA (US);

Kuangcai Chen, Alpharetta, GA (US);

Fei Zhao, Atlanta, GA (US);

Inventors:

Ning Fang, Alpharetta, GA (US);

Bin Dong, Atlanta, GA (US);

Kuangcai Chen, Alpharetta, GA (US);

Fei Zhao, Atlanta, GA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/64 (2006.01); G01J 3/02 (2006.01); G01N 21/65 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01J 3/0208 (2013.01); G01J 3/0294 (2013.01); G01J 3/4406 (2013.01); G01J 3/4412 (2013.01); G01N 21/65 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01);
Abstract

An integrated spectro-microscopic system for multimodality imaging on a sample includes a reflected differential interference contrast (RDIC) microscope, a Raman spectroscope optically coupled with the RDIC microscope and a total internal reflection fluorescence/scattering (TIRF/TIRS) microscope optically coupled with the RDIC microscope such that the integrated spectro-microscopic system is capable of simultaneously acquiring both the RDIC images, the Raman spectra and TIRF/TIRS images on the same sample.


Find Patent Forward Citations

Fang, Ning. (2022). Integration system of raman spectroscopy with advanced light microscopy and applications of same (U.S. Patent No. 11327019). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11327019

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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