The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Nov. 16, 2020
Anton Paar Gmbh, Graz, AT;
Otto Scheibelhofer, Hainersdorf, AT;
Roman Benes, Graz, AT;
Anton Paar GmbH, Graz, AT;
Abstract
A device is provided for IR-spectroscopy and for determining an impairment of a surface which is exposed to measuring radiation during the IR-spectroscopy. The device includes a radiation source to generate the measuring radiation a detector and a sample receptacle for receiving a sample. The sample receptacle is at least partially delimited by the surface. The detector measures radiation after interaction with the sample. The device is configured to measure an IR-reference spectrum of a reference sample which is received in the sample receptacle, evaluate the reference spectrum, determine an indicator of the impairment, wherein evaluating encompasses an integration of a quantity which is based on the reference spectrum over a predetermined integration spectral range, wherein the indicator is determined dependently on a value of the integration.