The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Oct. 26, 2018
Applicant:

Arkray, Inc., Kyoto, JP;

Inventors:

Akihiro Yamamoto, Kyoto, JP;

Naoto Shichi, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); B01L 9/00 (2006.01); G01N 21/59 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/05 (2013.01); B01L 9/527 (2013.01); G01N 21/59 (2013.01); G01N 35/00029 (2013.01); G01N 35/1095 (2013.01); B01L 3/502715 (2013.01); B01L 2200/025 (2013.01); G01N 2021/052 (2013.01); G01N 2035/00039 (2013.01); G01N 2035/00158 (2013.01); G01N 2035/1037 (2013.01);
Abstract

An analysis device includes a guide-in section, a placement section, an illumination member, a pressing member, and a measurement member. The guide-in section is configured to guide a rectangular block shaped analysis kit containing a sample. The analysis kit is placed on the placement section in the guide-in section. The illumination member is inserted into an insertion hole formed in the analysis kit, contacts a bottom of the insertion hole, and illuminates light onto the sample. The pressing member is configured by a separate body to the illumination member and presses the analysis kit such that the analysis kit placed on the placement section is sandwiched between the pressing member and the placement section and retained at a predetermined position. The measurement section measures a component present in the sample using light illuminated from the illumination member onto the sample in the analysis kit placed on the placement section.


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