The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Sep. 27, 2018
Applicant:

Minebea Mitsumi Inc., Nagano, JP;

Inventors:

Toshiaki Asakawa, Shizuoka, JP;

Akiyo Yuguchi, Shizuoka, JP;

Yuta Aizawa, Shizuoka, JP;

Syota Taneda, Nagano, JP;

Assignee:

MINEBEA MITSUMI Inc., Nagano, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); G01B 7/16 (2006.01);
U.S. Cl.
CPC ...
G01L 1/2287 (2013.01); G01B 7/18 (2013.01);
Abstract

A strain gauge includes a flexible substrate, and a functional layer formed of a metal, an alloy, or a metal compound, directly on one surface of the substrate. The strain gauge includes a resistor formed of a film including Cr, CrN, and CrN, on one surface of the functional layer. The substrate includes a filler. Surface unevenness on one surface of the substrate is 15 nm or less, and the resistor has a film thickness of 0.05 μm or more.


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