The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Sep. 19, 2019
Applicant:
Marvell Asian Pte Ltd., Singapore, SG;
Inventors:
Sadettin Cirit, Santa Clara, CA (US);
Karthik S. Gopalakrishnan, Santa Clara, CA (US);
Assignee:
Marvell Asia Pte Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/00 (2006.01); H04Q 9/00 (2006.01); G01K 7/01 (2006.01); G01R 19/25 (2006.01); G01K 1/14 (2021.01); G01K 13/00 (2021.01); G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
G01K 7/00 (2013.01); G01K 1/14 (2013.01); G01K 7/01 (2013.01); G01K 13/00 (2013.01); G01K 15/005 (2013.01); G01R 19/2503 (2013.01); H04Q 9/00 (2013.01); G01K 2219/00 (2013.01);
Abstract
The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.