The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Mar. 23, 2020
Applicant:

Medit Corp., Seoul, KR;

Inventors:

Soo bok Lee, Seongnam-si, KR;

Seung Jin Lee, Gunpo-si, KR;

Eun Gil Cho, Gunpo-si, KR;

Assignee:

MEDIT CORP., Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); H04N 13/254 (2018.01); G02B 19/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G02B 19/0061 (2013.01); H04N 13/254 (2018.05);
Abstract

A structured light projection optical system for obtaining 3D data of an object surface includes a structured light projection optical part configured to project a plurality of patterns onto an object or a screen, and an imaging optical part configured to obtain 3D data by photographing the patterns being projected from the structured light projection optical part. The structured light projection optical part includes a plurality of light sources, and a plurality of pattern masks. As the plurality of light sources are turned on and off, the pattern mask matches any one of the plurality of light sources illuminating a light, and the plurality of patterns are projected on the object or the screen by the pattern mask. Accordingly, various patterns can be effectively projected, real-time measurement can be easily performed through a quick pattern change, and the accurate 3D data can be obtained.


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