The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Apr. 07, 2020
Applicant:
Invitae Corporation, San Francisco, CA (US);
Inventors:
Adrian Nielsen Fehr, San Francisco, CA (US);
Patrick James Collins, San Francisco, CA (US);
Jill Lyndon Herschleb, San Francisco, CA (US);
Hywel Bowden Jones, San Francisco, CA (US);
Assignee:
Invitae Corporation, San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6827 (2018.01); C12Q 1/6809 (2018.01); C12Q 1/6825 (2018.01); C12Q 1/6837 (2018.01); C12Q 1/6876 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6827 (2013.01); C12Q 1/6809 (2013.01); C12Q 1/6825 (2013.01); C12Q 1/6837 (2013.01); C12Q 1/6876 (2013.01); C12Q 2600/156 (2013.01); C12Q 2600/158 (2013.01); C12Q 2600/16 (2013.01);
Abstract
The invention relates to methods of detecting a genetic variation in a genetic sample from a subject using labeled probes and counting the number of labels in the probes.