The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Apr. 27, 2018
Applicant:

Tokuyama Corporation, Shunan, JP;

Inventors:

Akimasa Kuramoto, Shunan, JP;

Yukihiro Kanechika, Shunan, JP;

Assignee:

TOKUYAMA CORPORATION, Shunan, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 21/072 (2006.01); C08K 3/28 (2006.01);
U.S. Cl.
CPC ...
C01B 21/0726 (2013.01); C01B 21/072 (2013.01); C08K 3/28 (2013.01); C01P 2004/03 (2013.01); C01P 2004/54 (2013.01); C01P 2004/61 (2013.01); C01P 2006/80 (2013.01); C08K 2003/282 (2013.01); C08K 2201/005 (2013.01); C08K 2201/016 (2013.01);
Abstract

An aluminum nitride particle including: a plurality of planes randomly arranged in a surface of the particle, the plurality of planes forming an obtuse ridge part or an obtuse valley part in the surface of the particle, the plurality of planes being observable in a scanning electron micrograph with 500 times magnification; wherein the particle has a longer diameter L of 20 to 200 μm; a ratio L/D of the longer diameter L (unit: μm) to a shorter diameter D (unit: μm) of the particle is 1 to 1.25; and the plurality of planes comprise a first plane, wherein an area S (unit: μm) of the first plane satisfies S/L≥1.0 μm.


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