The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Jul. 16, 2019
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Ryan Wade Penny, Cambridge, MA (US);

Anastasios John Hart, Waban, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/10 (2017.01); B29C 64/264 (2017.01); H04J 14/00 (2006.01); B29C 64/245 (2017.01); B29C 64/277 (2017.01); B29C 64/227 (2017.01); B29C 64/286 (2017.01); B29C 64/393 (2017.01); B29C 64/188 (2017.01); B29C 64/141 (2017.01); B33Y 50/02 (2015.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01);
U.S. Cl.
CPC ...
B29C 64/10 (2017.08); B29C 64/141 (2017.08); B29C 64/188 (2017.08); B29C 64/227 (2017.08); B29C 64/245 (2017.08); B29C 64/277 (2017.08); B29C 64/286 (2017.08); B29C 64/393 (2017.08); H04J 14/00 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

Systems, devices, and methods for additive manufacturing as disclosed allow for improved optical access to a build platform. In at least some embodiments a multiplexing optic of an additive manufacturing device is configured to multiplex an arbitrary number of optical paths to a build platform along a substantially common optical axis by dividing a theoretical input aperture of the multiplexing optic into a plurality of sub-apertures. Each sub-aperture can independently receive and direct an optical path to the build platform. An optical path can be a light path from a light source or an optical process monitoring path from an optical process monitoring system or optical process monitoring device. In some embodiments, an optical path can enter the multiplexing optic off-axis and/or off-angle with respect to an optical axis of the multiplexing optic. The multiplexing optic can include one or more lens elements and/or one or more mirror elements.


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